Title page for ETD etd-1031103-133101


Type of Document Master's Thesis
Author Aluri, Srinivas Rao
Author's Email Address saluri1@lsu.edu
URN etd-1031103-133101
Title Iddq Testing of a CMOS 10-Bit Charge Scaling Digital-to-Analog Converter
Degree Master of Science in Electrical Engineering (M.S.E.E.)
Department Electrical & Computer Engineering
Advisory Committee
Advisor Name Title
Ashok Srivastava Committee Chair
Martin Feldman Committee Member
Pratul K. Ajmera Committee Member
Keywords
  • iddq testing
Date of Defense 2003-10-28
Availability unrestricted
Abstract
This work presents an effective built-in current sensor (BICS), which has a very small impact on the performance of the circuit under test (CUT). The proposed BICS works in two-modes the normal mode and the test mode. In the normal mode the BICS is isolated from the CUT due to which there is no performance degradation of the CUT. In the testing mode, our BICS detects the abnormal current caused by permanent manufacturing defects. Further more our BICS can also distinguish the type of defect induced (Gate-source short, source-drain short and drain-gate short). Our BICS requires neither an external voltage source nor current source. Hence the BICS requires less area and is more efficient than the conventional current sensors. The circuit under test is a 10-bit digital to analog converter using charge-scaling architecture.
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